Exchange bias and diffusion processes in laser annealed CoFeB/IrMn thin films
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H. Exner | A. Sharma | D. Zahn | G. Salvan | P. Mack | P. Matthes | A. Horn | O. Selyshchev | Apoorva Sharma | D. Zahn | M. Hoffmann | S. Schulz | S. Busse | M. A. Hoffmann | Patrick Matthes | Horst Exner