Design rules to minimize the effect of joule heating in Greek cross test structures
暂无分享,去创建一个
[1] R. L. Mattis,et al. Design considerations for the cross-bridge sheet resistor , 1982 .
[2] H. A. Schafft,et al. Thermal conductivity measurements of thin-film silicon dioxide , 1989, Proceedings of the 1989 International Conference on Microelectronic Test Structures.
[3] A. J. Walton,et al. MICROELECTRONIC TEST STRUCTURES , 1999 .
[4] W. R. Thurber,et al. Bridge and van der Pauw Sheet Resistors for Characterizing the Line Width of Conducting Layers , 1978 .
[5] Oliver Paul,et al. A thermal van der Pauw test structure , 1999, ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307).
[6] Martin G. Buehler,et al. A numerical analysis of various cross sheet resistor test structures , 1977 .
[7] W. Versnel. Analysis of the Greek cross, a Van der Pauw structure with finite contacts , 1979 .
[8] W. R. Thurber,et al. An Experimental Study of Various Cross Sheet Resistor Test Structures , 1978 .