Built-in quality assurance
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[1] Yervant Zorian,et al. An Effective BIST Scheme for ROM's , 1992, IEEE Trans. Computers.
[2] Yervant Zorian,et al. Built-in self-test for digital integrated circuits , 1994, AT&T Technical Journal.
[3] Yervant Zorian,et al. A distributed BIST control scheme for complex VLSI devices , 1993, Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium.
[4] Hans-Joachim Wunderlich,et al. Parallel self-test and the synthesis of control units , 1991 .
[5] Richard L. Campbell,et al. Testing goes critical path , 1994, AT&T Technical Journal.
[6] Vishwani D. Agrawal,et al. A Tutorial on Built-in Self-Test. I. Principles , 1993, IEEE Des. Test Comput..
[7] Yervant Zorian,et al. Programmable space compaction for BIST , 1993, FTCS-23 The Twenty-Third International Symposium on Fault-Tolerant Computing.
[8] Yervant Zorian,et al. Automated BIST for regular structures embedded in ASIC devices , 1990, AT&T Technical Journal.
[9] R. L. Campbell. Creating wealth—through testing? , 1992 .