NanoSurf IV: traceable measurement of surface texture at the National Physical Laboratory, UK
暂无分享,去创建一个
[1] R K Leach. Calibration, traceability and uncertainty issues in surface texture metrology. , 1999 .
[2] K. P. Birch,et al. Optical fringe subdivision with nanometric accuracy , 1990 .
[3] P L Heydemann,et al. Determination and correction of quadrature fringe measurement errors in interferometers. , 1981, Applied optics.
[4] K. Lindsey,et al. Sub-Nanometre Surface Texture and Profile Measurement with NANOSURF 2 , 1988 .
[5] Load-dependent behavior in PTFE-glass sideways , 1997 .
[6] Maurice G. Cox,et al. Verification of a polarization-insensitive optical interferometer system with subnanometric capability , 1995 .
[7] Stuart T. Smith,et al. Foundations of ultraprecision mechanism design , 1992 .
[8] K. W. Raine,et al. Beam-splitter Coatings for Producing Phase Quadrature Interferometer Outputs , 1978 .