Degradation in AlGaN-based UV-C LEDs under constant current stress: A study on defect behaviors
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Y. Hao | Xiao-hua Ma | Jincheng Zhang | Xuefeng Zheng | Renli Liang | J. Dai | Wei Mao | Jiaduo Zhu | Shengrui Xu | Xiaowei Zhou | Linlin Xu | Peixian Li | Yingzhe Wang