Identifying chemical and physical changes in wide-gap semiconductors using real-time and near ambient-pressure XPS.
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D. Evans | S. Cooil | Rosa Arrigo | R. Cross | G. Held | P. Ferrer | F. Venturini | M. Allen | Rachel E. Cross | D. Grinter | Di Hu | Gruffudd Williams | Simon Astley | Kerry Hazeldine | J. Ash | James Evans | Kelvin James | Kerry Hazeldine