Analysis of electron intensity as a function of aperture size in energy-filtered transmission electron microscope imaging
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E. Stach | J. Howe | D. Veblen | K. Moore | T. M. Murray
[1] J. Howe,et al. Analysis of diffraction contrast as a function of energy loss in energy-filtered transmission electron microscope imaging , 1999 .
[2] J. Howe,et al. Scanning and transmission electron microscope investigation of preferential thinning during ion beam milling of an Al-Ag alloy containing γ precipitate plates and the subsequent effects on microanalysis , 1999 .
[3] J. Howe,et al. In situ high-resolution electron spectroscopic imaging of precipitate growth in an AlAg alloy , 1998 .
[4] H. Kohl,et al. Theoretical and experimental investigations of resolution and detection limits in energy-filtering electron microscopy , 1997 .
[5] G. Kothleitner,et al. Quantitative analysis of EFTEM elemental distribution images , 1997 .
[6] M. Nelhiebel,et al. Diffraction effects in electron spectroscopic imaging , 1996 .
[7] F. Hofer,et al. Improved imaging of secondary phases in solids by energy-filtering TEM , 1996 .
[8] R. Egerton,et al. Electron Energy-Loss Spectroscopy in the Electron Microscope , 1995, Springer US.
[9] W. Grogger,et al. Imaging of nanometer-sized precipitates in solids by electron spectroscopic imaging , 1995 .
[10] J. Mayer,et al. Energy-filtered transmission electron microscopy of SimGen superlattices and SiGe heterostructures I. Experimental results , 1995 .
[11] P. Crozier. Quantitative elemental mapping of materials by energy-filtered imaging , 1995 .
[12] R. Leapman,et al. Electron energy-loss chemical imaging of polymer phases , 1995 .
[13] J. Mayer,et al. Detection limits in elemental distribution images produced by energy filtering TEM: case study of grain boundaries in Si3N4 , 1994 .
[14] J Kirz,et al. Chemical contrast in X-ray microscopy and spatially resolved XANES spectroscopy of organic specimens. , 1992, Science.
[15] L. Reimer,et al. Contrast in the electron spectroscopic imaging mode of a TEM , 1990 .
[16] R. Egerton,et al. EELS log-ratio technique for specimen-thickness measurement in the TEM. , 1988, Journal of electron microscopy technique.
[17] A. Howie,et al. Image Contrast And Localized Signal Selection Techniques , 1979 .
[18] H. Kohl,et al. Optimum imaging parameters for elemental mapping in an energy filtering transmission electron microscope , 1993 .
[19] R. Leapman,et al. Quantitative electron energy loss spectroscopy in biology. , 1988, Ultramicroscopy.
[20] L. Reimer,et al. Operation modes of electron spectroscopic imaging and electron energy-loss spectroscopy in a transmission electron microscope , 1988 .
[21] D. Joy,et al. The choice of operating parameters for microanalysis by electron energy-loss spectroscopy , 1978 .