The use of linear models in A/D converter testing

This paper demonstrates how a linear modeling technique can be applied to three common methods for testing analog-to-digital converters (ADC's)-the servo-loop method, the tally-and-weight method, and the code density method-to improve their efficiency and accuracy. In order to compare the accuracy of the test procedures that incorporate the linear modeling technique with the corresponding procedures that do not, confidence intervals are derived for the integral and differential nonlinearity (INL and DNL) estimates obtained in both cases. Since the linear model may itself introduce some error in the estimates, the accuracy of the model must be determined in order to make the comparisons meaningful. This is accomplished by using a nested experimental design to determine how much of the variance in the transition levels is accounted for by the model.

[1]  E. Lehmann Testing Statistical Hypotheses , 1960 .

[2]  J. Doernberg,et al.  Full-speed testing of A/D converters , 1984 .

[3]  J. S. Williams A confidence interval for variance components , 1962 .

[4]  Gerard N. Stenbakken,et al.  Test-point selection and testability measures via QR factorization of linear models , 1987, IEEE Transactions on Instrumentation and Measurement.

[5]  Solomon Max Fast accurate and complete ADC testing , 1989, Proceedings. 'Meeting the Tests of Time'., International Test Conference.

[6]  J. A. Connelly,et al.  An analysis methodology to identify dominant noise sources in D/A and A/D converters , 1991 .

[7]  Matthew Mahoney,et al.  DSP-Based Testing of Analog and Mixed-Signal Circuits , 1987 .

[8]  Gerard N. Stenbakken,et al.  LINEAR ERROR MODELING OF ANALOG AND MIXED-SIGNAL DEVICES , 1991, 1991, Proceedings. International Test Conference.

[9]  T. W. Anderson An Introduction to Multivariate Statistical Analysis , 1959 .

[10]  Gerard N. Stenbakken,et al.  A comprehensive approach for modeling and testing analog and mixed-signal devices , 1990, Proceedings. International Test Conference 1990.

[11]  G. N. Stenbakken,et al.  Developing linear error models for analog devices , 1993 .

[12]  Welch Bl THE GENERALIZATION OF ‘STUDENT'S’ PROBLEM WHEN SEVERAL DIFFERENT POPULATION VARLANCES ARE INVOLVED , 1947 .

[13]  A.L. Sangiovanni-Vincentelli,et al.  Behavioral modeling and simulation of data converters , 1992, [Proceedings] 1992 IEEE International Symposium on Circuits and Systems.

[14]  E. Hnatek Digital Integrated Circuit Testing from a Quality Perspective , 1993 .

[15]  Gene H. Golub,et al.  Matrix computations , 1983 .