Signature Analysis for Multiple-Output Circuits

A scheme of a good signature analysis by a linear feedback shift register (LFSR) is presented. It works for k-output circuits, even if k is greater than the register length. It is built according to rules which are presented in the correspondence, taking into account error models which are introduced. The rules are derived from a property which is formally shown for one kind of LFSR. However, some of them apply to other LFSR schemes too.

[1]  J. Mucha,et al.  Built-In Test for Complex Digital Integrated Circuits , 1979, Fifth European Solid State Circuits Conference - ESSCIRC 79.

[2]  John E. Bauer,et al.  An Advanced Fault Isolation System for Digital Logic , 1975, IEEE Transactions on Computers.

[3]  J. Lawrence Carter,et al.  The theory of signature testing for VLSI , 1982, STOC '82.

[4]  James E. Smith,et al.  Measures of the Effectiveness of Fault Signature Analysis , 1980, IEEE Transactions on Computers.

[5]  René David,et al.  Testing by Feedback Shift Register , 1980, IEEE Transactions on Computers.

[6]  Jacob Savir,et al.  Syndrome-Testable Design of Combinational Circuits , 1980, IEEE Transactions on Computers.