Evaluation of signature-based testing of RF/analog circuits

Due to its low cost, low test time and reduced test complexity, structural testing is preferred to functional whenever possible. The study presented in this paper indicates that the two low-frequency structural test methods considered, power supply current monitoring and the power supply ramping technique, provide a valuable supplement/alternative when one of the functional tests (gain, noise figure and total harmonic distortion) in the test set can be complemented or substituted by structural test and add to or maintain no loss of fault coverage.

[1]  Igor M. Filanovsky,et al.  A novel wide-band CMOS current amplifying cell and its application in power supply current monitoring , 2001, ICECS 2001. 8th IEEE International Conference on Electronics, Circuits and Systems (Cat. No.01EX483).

[2]  Keith Baker,et al.  Analogue fault simulation based on layout dependent fault models , 1994, Proceedings., International Test Conference.

[3]  B. R. Bannister,et al.  Can supply current monitoring be applied to the testing of analogue as well as digital portions of mixed ASICs? , 1992, [1992] Proceedings The European Conference on Design Automation.

[4]  Georges Gielen,et al.  Testing of analog integrated circuits based on power-supply current monitoring and discrimination analysis , 1994, Proceedings of IEEE 3rd Asian Test Symposium (ATS).

[5]  J. B. Coughlin,et al.  A monolithic silicon wide-band amplifier from DC to 1 GHz , 1973 .

[6]  Wojciech Maly,et al.  FAULT MODELING FOR THE TESTING OF MIXED INTEGRATED CIRCUITS , 1991, 1991, Proceedings. International Test Conference.

[7]  P. O'Leary,et al.  Fault detection method using power supply spectrum analysis , 1990 .

[8]  Eric Bruls.  Variable supply voltage testing for analogue CMOS and bipolar circuits , 1994, Proceedings., International Test Conference.

[9]  B. R. Bannister,et al.  Testing mixed signal ASICs through the use of supply current monitoring , 1993, Proceedings ETC 93 Third European Test Conference.

[10]  H. J. Carlin,et al.  A New Method of Broad-Band Equalization Applied to Microwave Amplifiers , 1979 .

[11]  H. Manhaeve,et al.  Implementation of BIC monitor in balanced analogue self-test , 1996 .

[12]  Edgar Sánchez-Sinencio,et al.  A power supply ramping and current measurement based technique for analog fault diagnosis , 1994, Proceedings of IEEE VLSI Test Symposium.

[13]  Alkis A. Hatzopoulos,et al.  Analogue fault identification based on power supply current spectrum , 1993 .

[14]  D. M. H. Walker,et al.  A practical built-in current sensor for I/sub DDQ/ testing , 2001, Proceedings International Test Conference 2001 (Cat. No.01CH37260).

[15]  Mani Soma,et al.  An experimental approach to analog fault models , 1991, Proceedings of the IEEE 1991 Custom Integrated Circuits Conference.

[16]  Guido Gronthoud,et al.  Vdd ramp testing for rf circuits , 2003, International Test Conference, 2003. Proceedings. ITC 2003..