论文信息 - In Situ Solar Wafer Temperature Measurement during Firing Process via Inline IR Thermography - 字舞流文

In Situ Solar Wafer Temperature Measurement during Firing Process via Inline IR Thermography

Florian Clement | Stefan W. Glunz | F. Clement | S. Glunz | A. Csordas | G. Emanuel | Attila Csordás | Gernot Emanuel | Christoph Sternkiker | Daniel Ourinson | Gunnar Dammaß | Harald Müller | G. Dammass | C. Sternkiker | D. Ourinson | H. Müller

[1] P. Liley,et al. Thermal Conductivity of Selected Materials , 1966 .

[2] Nuggehalli M. Ravindra,et al. Modeling and simulation of emissivity of silicon-related materials and structures , 2003 .

[3] M. Gauthier,et al. Impact of the firing step on Al2O3 passivation on p-type Czochralski Si wafers: Electrical and chemical approaches , 2015 .

[4] M. Green,et al. 22.8% efficient silicon solar cell , 1989 .

[5] Wilhelm Warta,et al. Degradation of Crystalline Silicon Due to Boron–Oxygen Defects , 2017, IEEE Journal of Photovoltaics.

[6] Wilhelm Warta,et al. Lock-in thermography , 2003 .

[7] Conveyor Belt Furnace Thermal Processing , 2017 .

[8] L. Frisson,et al. Thick-film metallization for solar cell applications , 1984, IEEE Transactions on Electron Devices.