SOCRATE: an optical bench dedicated to the understanding and improvement of a laser conditioning process.

We present an automatic excimer laser bench (SOCRATE) allowing for the treatment of optical components by laser conditioning. This apparatus, developed at the Commissariat a l'Energie Atomique-Le Ripault, has been designed to add to this conditioning process an in situ, accurate laser-induced damage threshold (LIDT) measurement and different nondestructive optical techniques for the characterization of the component during treatment. Through different examples, we demonstrate the importance of these characterizations to improve the understanding of the laser conditioning. The role of an in situ adapted metrology associated in real time with a laser conditioning bench offers new opportunities to analyze laser-induced damage mechanisms and subsequently to increase the LIDT of optical components.

[1]  Daniel Plessis,et al.  Excimer laser conditioning of KDP: correlation of nondestructive optical diagnostics at 351nm with laser damage threshold , 2005, SPIE Laser Damage.

[2]  Michael D. Feit,et al.  The nature of emission from optical breakdown induced by pulses of fs and ns duration , 2005, SPIE Laser Damage.

[3]  Michael D. Feit,et al.  Implications of nanoabsorber initiators for damage probability curves, pulselength scaling, and laser conditioning , 2003, SPIE Laser Damage.

[4]  S G Demos,et al.  Investigation of laser annealing parameters for optimal laser-damage performance in deuterated potassium dihydrogen phosphate. , 2005, Optics letters.

[5]  M Commandré,et al.  Effect of multiple laser irradiations on silica at 1064 and 355 nm. , 2005, Optics letters.

[6]  Herve Bercegol,et al.  What is laser conditioning: a review focused on dielectric multilayers , 1999, Laser Damage.

[7]  Bertrand Bertussi,et al.  Effect of polishing process on silica surface laser-induced damage threshold at 355 nm , 2004 .

[8]  Michael J. Runkel,et al.  Results of raster-scan laser conditioning studies on DKDP triplers using Nd:YAG and excimer lasers , 2002, SPIE Laser Damage.

[9]  Michael D. Feit,et al.  Pulse length dependence of laser conditioning and bulk damage in KD2PO4 , 2005, SPIE Laser Damage.

[10]  Michael J. Runkel,et al.  Overview of raster scanning for ICF-class laser optics , 2003, SPIE Laser Damage.

[11]  A. Boccara,et al.  Photothermal deflection spectroscopy and detection. , 1981, Applied optics.

[12]  Claude Amra,et al.  Laser-induced damage of materials in bulk, thin-film, and liquid forms. , 2002, Applied optics.

[13]  A. Chmel,et al.  Fatigue laser-induced damage in transparent materials , 1997 .

[14]  M. R. Perrone,et al.  Numerical simulation of excimer lasers with unstable resonators , 1994 .

[15]  Daniel Plessis,et al.  Excimer laser conditionning of KDP: influence of the laser parameters and crystal orientation on the laser damage threshold , 2005, SPIE Laser Damage.

[16]  Stavros G. Demos,et al.  Stoichiometric changes to KH2PO4 during laser-induced breakdown , 2005, SPIE Laser Damage.

[17]  Laurent Gallais,et al.  Optimized metrology for laser-damage measurement: application to multiparameter study. , 2003, Applied optics.

[18]  M. Andre,et al.  The French Megajoule Laser Project (LMJ) , 1999 .

[19]  Stavros G. Demos,et al.  System for evaluation of laser-induced damage performance of optical materials for large aperture lasers , 2004 .

[20]  Mireille Commandré,et al.  Characterization of optical coatings by photothermal deflection. , 1996, Applied optics.

[21]  Stavros G. Demos,et al.  Raman scattering investigation of KH2PO4 subsequent to high fluence laser irradiation , 1998 .

[22]  M. Feit,et al.  Laser-induced damage in deuterated potassium dihydrogen phosphate. , 2003, Applied optics.

[23]  Bertrand Bertussi,et al.  Highlighting of local inhomogeneity in excimer conditioning of KDP , 2005, SPIE Laser Damage.

[24]  Stavros G Demos,et al.  Application of fluorescence microscopy for noninvasive detection of surface contamination and precursors to laser-induced damage. , 2002, Applied optics.