Director field in a liquid crystal: direct measurement method

The refractive index profile (RIP) is measured to provide data for obtaining local optical axis arrangement in the waveguide cross-section. Measurements have been made in the electric field applied perpendicularly across the layer in a liquid crystalline waveguide. New approach is proposed to accomplish RIP measurement in a direct way. The m - line method is presented as a tool that allows one to do it and to improve the attenuated total reflection disadvantages as well. Obtained results maintain applicability of the m - line method for a direct RIP measurement. Nematic LC layer has been examined as well described in the literature to verify observations. Most interesting seems those results illustrating the presence and the deformation of the boundary layer in homogeneous LC layer alignment.