Similarity Scores Based on Background Samples

Evaluating the similarity of images and their descriptors by employing discriminative learners has proven itself to be an effective face recognition paradigm. In this paper we show how “background samples”, that is, examples which do not belong to any of the classes being learned, may provide a significant performance boost to such face recognition systems. In particular, we make the following contributions. First, we define and evaluate the “Two-Shot Similarity” (TSS) score as an extension to the recently proposed “One-Shot Similarity” (OSS) measure. Both these measures utilize background samples to facilitate better recognition rates. Second, we examine the ranking of images most similar to a query image and employ these as a descriptor for that image. Finally, we provide results underscoring the importance of proper face alignment in automatic face recognition systems. These contributions in concert allow us to obtain a success rate of 86.83% on the Labeled Faces in the Wild (LFW) benchmark, outperforming current state-of-the-art results.

[1]  R. Fisher THE USE OF MULTIPLE MEASUREMENTS IN TAXONOMIC PROBLEMS , 1936 .

[2]  David G. Stork,et al.  Pattern Classification , 1973 .

[3]  Matti Pietikäinen,et al.  A comparative study of texture measures with classification based on featured distributions , 1996, Pattern Recognit..

[4]  Shimon Edelman,et al.  Representation and recognition in vision , 1999 .

[5]  T. Poggio,et al.  Hierarchical models of object recognition in cortex , 1999, Nature Neuroscience.

[6]  David G. Stork,et al.  Pattern Classification (2nd ed.) , 1999 .

[7]  Jitendra Malik,et al.  Shape Context: A New Descriptor for Shape Matching and Object Recognition , 2000, NIPS.

[8]  N. Cristianini,et al.  On Kernel-Target Alignment , 2001, NIPS.

[9]  Trevor Hastie,et al.  The Elements of Statistical Learning , 2001 .

[10]  Mads Nielsen,et al.  Computer Vision — ECCV 2002 , 2002, Lecture Notes in Computer Science.

[11]  Misha Pavel,et al.  Adjustment Learning and Relevant Component Analysis , 2002, ECCV.

[12]  Michael I. Jordan,et al.  Distance Metric Learning with Application to Clustering with Side-Information , 2002, NIPS.

[13]  Gal Chechik,et al.  Extracting Relevant Structures with Side Information , 2002, NIPS.

[14]  Tomer Hertz,et al.  Learning Distance Functions using Equivalence Relations , 2003, ICML.

[15]  Thorsten Joachims,et al.  Transductive Learning via Spectral Graph Partitioning , 2003, ICML.

[16]  Michael Fink,et al.  Object Classification from a Single Example Utilizing Class Relevance Metrics , 2004, NIPS.

[17]  Raymond J. Mooney,et al.  Integrating constraints and metric learning in semi-supervised clustering , 2004, ICML.

[18]  Michael Fink Object Classication from a Single Example Utilizing Class Relevance Pseudo-Metrics , 2004, NIPS 2004.

[19]  Kilian Q. Weinberger,et al.  Distance Metric Learning for Large Margin Nearest Neighbor Classification , 2005, NIPS.

[20]  Shimon Ullman,et al.  Single-example Learning of Novel Classes using Representation by Similarity , 2005, BMVC.

[21]  Pietro Perona,et al.  One-shot learning of object categories , 2006, IEEE Transactions on Pattern Analysis and Machine Intelligence.

[22]  Bernhard Schölkopf,et al.  Introduction to Semi-Supervised Learning , 2006, Semi-Supervised Learning.

[23]  M. Brand,et al.  Fast low-rank modifications of the thin singular value decomposition , 2006 .

[24]  Jitendra Malik,et al.  SVM-KNN: Discriminative Nearest Neighbor Classification for Visual Category Recognition , 2006, 2006 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR'06).

[25]  Frédéric Jurie,et al.  Learning Visual Similarity Measures for Comparing Never Seen Objects , 2007, 2007 IEEE Conference on Computer Vision and Pattern Recognition.

[26]  Erik G. Learned-Miller,et al.  Unsupervised Joint Alignment of Complex Images , 2007, 2007 IEEE 11th International Conference on Computer Vision.

[27]  Andrew J. Davison,et al.  Active Matching , 2008, ECCV.

[28]  Trevor Darrell,et al.  Transfer learning for image classification with sparse prototype representations , 2008, 2008 IEEE Conference on Computer Vision and Pattern Recognition.

[29]  Wei Liu,et al.  Output Regularized Metric Learning with Side Information , 2008, ECCV.

[30]  Marwan Mattar,et al.  Labeled Faces in the Wild: A Database forStudying Face Recognition in Unconstrained Environments , 2008 .

[31]  Yaniv Taigman,et al.  Descriptor Based Methods in the Wild , 2008 .

[32]  Tal Hassner,et al.  Multiple One-Shots for Utilizing Class Label Information , 2009, BMVC.

[33]  Tal Hassner,et al.  The One-Shot similarity kernel , 2009, 2009 IEEE 12th International Conference on Computer Vision.

[34]  Nicolas Pinto,et al.  How far can you get with a modern face recognition test set using only simple features? , 2009, CVPR.

[35]  Matthijs C. Dorst Distinctive Image Features from Scale-Invariant Keypoints , 2011 .