Research on test-generation technology of combined digital IC

This article introduced the basic conception of combined digital IC,including classification of digital IC test,controllability,observation,testability,fault,limitation and invalidation etc.Then it summarized theory of test generation and test process of combined digital IC.It emphasized test-generating algorithms of digital IC.These algorithms included BULL differences,XOR,PATH sensitize,D,PODEM and FAN algorithm and were all basic algorithms of test generation that can be used in different applications.