Evaluation of electrical guardband testing

Abstract : Electrical guardband testing of microcircuits in lieu of 100% testing at the device temperature extremes has long been championed by device manufacturers as a cost effective means of guaranteeing reliable device performance in military systems. This report describes a detailed study of the validity of the guardbanding concept and the effects of manufacturer, datecode, and reliability grade upon these devices. Through the utilization of intensive testing techniques in conjunction with the development of a series of linear, log-linear, and exponential mathematical models a high degree of guardband test limit validity was established. Further analysis of the data utilizing advanced statistical techniques resulted in the development of a method for accurately setting guardband test limits on most parameters. Additional correlation analysis was performed on the test samples resulting in the establishment of the interchangeabiliy of JAN, 883B processed, and commerical devices. (Author)