Interfacial Impurities and Their Electronic Signatures in High‐Voltage Regrown Nonpolar m‐Plane GaN Vertical p–n Diodes
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A. Allerman | D. Feezell | M. Crawford | G. Pickrell | M. Monavarian | A. Aragon | I. Stricklin | A. Armstrong
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A. Allerman | D. Feezell | M. Crawford | G. Pickrell | M. Monavarian | A. Aragon | I. Stricklin | A. Armstrong