Gallium Nitride RF Technology Advances and Applications

Over the last decade, Gallium Nitride (GaN) proponents have touted the technology as the future for high power cellular base stations that will displace silicon LDMOS devices. One may speculate on how LDMOS technological advances, GaN market acceptance, reliability, or cost have moderated GaN’s advance into the LDMOS domain. This paper discusses GaN technology, 200W packaged device performance, a 2.6-2.7 GHz, 400 W Doherty power amplifier, thermal management, and cost vs. performance. It emphasizes how GaN and LDMOS technology complement each other for RF applications. GaN devices have size and performance advantages over Si-LDMOS for frequencies above 2.5 GHz. On the other hand, LDMOS devices perform very competitively at 2.6 GHz using multiple devices in larger size circuits. Unlike Doherty amplifiers where GaN versus Si LDMOS may be a close question, GaN will dominate power amplifiers at frequencies in excess of 3 GHz as well for high efficiency and wideband power amplifiers.

[1]  Norihiko Ui,et al.  A 2.6GHz band 537W peak power GaN HEMT asymmetric Doherty amplifier with 48% drain efficiency at 7dB , 2012, 2012 IEEE/MTT-S International Microwave Symposium Digest.

[2]  Andreas Wentzel,et al.  RF class-S power amplifiers: State-of-the-art results and potential , 2010, 2010 IEEE MTT-S International Microwave Symposium.

[3]  Scott Allen,et al.  High-Efficiency Amplifiers Using AlGaN/GaN HEMTs on SiC , 2006 .

[4]  V. Miller,et al.  Full-Wafer Characterization of AlGaN/GaN HEMTs on Free-Standing CVD Diamond Substrates , 2010, IEEE Electron Device Letters.

[5]  P. Parikh,et al.  40-W/mm Double Field-plated GaN HEMTs , 2006, 2006 64th Device Research Conference.

[6]  D. Schmelzer,et al.  A GaN HEMT Class F Amplifier at 2 GHz With $>\,$80% PAE , 2006, IEEE Journal of Solid-State Circuits.