Single Event Transient Response Dependence on Operating Conditions for a Digital to Analog Converter

The Single Event Effect (SEE) characterization of a Digital to Analog Converter showed an unexpected Single Event Transient (SET) dependence on operating conditions. The worst case condition resulting in the highest probability of an SET was at the highest supply voltage. The SET signatures were dependent on the input code, with some signatures not present when the input code was at mid scale. The SET characterization results are presented, along with a simulation study that explains the SET response dependence on the operating conditions. These results emphasize the importance of running an SEE characterization on a mixed signal product and monitoring all aspects of the SET signatures, including probability, amplitude, pulse width and oscillatory behavior, to determine the worst case operating conditions.

[1]  Stephen LaLumondiere,et al.  Single event upset (SEU) sensitivity dependence of linear integrated circuits (ICs) on bias conditions , 1997 .

[2]  C. Poivey,et al.  Comparison of single-event transients induced in an operational amplifier (LM124) by pulsed laser light and a broad beam of heavy ions , 2004, IEEE Transactions on Nuclear Science.

[3]  D. McMorrow,et al.  Single-Event Transients in Bipolar Linear Integrated Circuits , 2006, IEEE Transactions on Nuclear Science.

[4]  S. P. Buchner,et al.  Complex SEU signatures in high-speed analog-to-digital conversion , 2001 .

[5]  H. R. Schwartz,et al.  Heavy ion and proton induced single event transients in comparators , 1996 .

[6]  G. C. Messenger,et al.  Collection of Charge on Junction Nodes from Ion Tracks , 1982, IEEE Transactions on Nuclear Science.

[7]  S. Crain,et al.  Variability in measured SEE sensitivity associated with design and fabrication iterations , 2003, 2003 IEEE Radiation Effects Data Workshop.

[8]  A. B. Campbell,et al.  Characterization of single-event upsets in a flash analog-to-digital converter (AD9058) , 2000 .

[9]  E. Petersen,et al.  Parametric and Threshold Studies of Single Event Sensitivity , 2007, IEEE Transactions on Nuclear Science.

[10]  L. D. Edmonds,et al.  A model for single-event transients in comparators , 2000 .

[11]  D. Lewis,et al.  Study of single-event transients in high-speed operational amplifiers , 2007, 2007 9th European Conference on Radiation and Its Effects on Components and Systems.

[12]  Ken LaBel,et al.  Testing Guidelines for Single Event Transient (SET) Testing of Linear Devices , 2003 .

[13]  M. Galloway,et al.  "Super" cocktails for heavy ion testing , 2007, 2007 IEEE Radiation Effects Data Workshop.