INL and DNL estimation based on noise for ADC test

This paper presents the linearity characterization of an analog-to-digital converter (ADC). The input signal is noise, which allows low analog area overhead for built-in self-test (BIST). The linearity error estimation is proposed based on the spectral analysis of only the output of the converter. This paper presents the underlying theory and practical results supporting the effectiveness of the proposed method.

[1]  Augustus J. E. M. Janssen,et al.  Estimating the integral non-linearity of A/D-converters via the frequency domain , 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).

[2]  Diego Bellan,et al.  ADC nonlinearities and harmonic distortion in FFT test , 1998, IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222).

[3]  Augustus J. E. M. Janssen,et al.  Fourier analysis and synthesis for a Mildly Non-linear Quantizer , 2000, Signal Process..

[4]  Stephen K. Sunter,et al.  A simplified polynomial-fitting algorithm for DAC and ADC BIST , 1997, Proceedings International Test Conference 1997.

[5]  Florence Azaïs,et al.  Implementation of a linear histogram BIST for ADCs , 2001, Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001.

[6]  Fang Xu.  A new approach for the nonlinearity test of ADCs/DACs and its application for BIST , 1999, European Test Workshop 1999 (Cat. No.PR00390).

[7]  E. W. Williams,et al.  Integrated converters : D to A and D architectures, analysis and simulation , 2001 .

[8]  L. Carro,et al.  A noise generator for analog-to-digital converter testing , 2002, Proceedings. 15th Symposium on Integrated Circuits and Systems Design.

[9]  Bozena Kaminska,et al.  BIST for D/A and A/D Converters , 1996, IEEE Des. Test Comput..

[10]  E. Brigham,et al.  The fast Fourier transform and its applications , 1988 .

[11]  Karim Arabi,et al.  Efficient and accurate testing of analog-to-digital converters using oscillation-test method , 1997, Proceedings European Design and Test Conference. ED & TC 97.

[12]  Florence Azaïs,et al.  Hardware resource minimization for histogram-based ADC BIST , 2000, Proceedings 18th IEEE VLSI Test Symposium.

[13]  Abhijit Chatterjee,et al.  A signature analyzer for analog and mixed-signal circuits , 1994, Proceedings 1994 IEEE International Conference on Computer Design: VLSI in Computers and Processors.

[14]  P. J. Green,et al.  Overview of IEEE-STD-1241 "standard for terminology and test methods for analog-to-digital converters" , 1999, IMTC/99. Proceedings of the 16th IEEE Instrumentation and Measurement Technology Conference (Cat. No.99CH36309).