Utilization of a Personal Computer for the Microstructural Analysis of a Duplex Stainless Steel

The combination of a personal computer and EPMA has been utilized in order to develop a simplified microanalysis equipment system which has nearly the same analyzing power in specifications as CMA or MA in image analysis.Image analyzed data for a duplex stainless steel 329J1 from the present system was compared with that from CMA and found to be in fairly good agreement with color mapping of the concentrations of Cr and Ni.The phase identification for α and γ phases by Cr/Ni partition ratio was also accomplished.