论文信息 - Cryogenic Characterization of the High Frequency and Noise Performance of SiGe HBTs From DC to 70 GHz and Down to 2 K - 字舞流文

Cryogenic Characterization of the High Frequency and Noise Performance of SiGe HBTs From DC to 70 GHz and Down to 2 K

P. Chevalier | P. Schvan | D. Céli | T. Jager | S. Bonen | S. Voinigescu | G. Cooke | A. Bharadwaj | S. Tripathi