论文信息 - Electro-optic measurements of the ferroelectric-paraelectric boundary in Ba1−xSrxTiO3 materials chips

Electro-optic measurements of the ferroelectric-paraelectric boundary in Ba1−xSrxTiO3 materials chips

The combinatorial material chip strategy is used to study the ferroelectric-paraelectric phase boundary of the Ba1−xSrxTiO3 thin film system. The electro-optic (EO) effect at different compositions is measured using a modified direct-current/alternating-current birefringence EO measurement technique. We find that Ba1−xSrxTiO3 thin films exhibit relaxor like behavior with diffused ferroelectric domains existing well past the previously defined ferroelectric-paraelectric boundary (x>0.3).

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