论文信息 - Force modulation microscopy of multilayered porous silicon samples

Force modulation microscopy of multilayered porous silicon samples

In this paper we report on Force Modulation Microscopy (FMM) study and force‐distance curve analysis of porous silicon layers grown on silicon. The characterization has been carried out on the cross section of porous silicon. The FMM images allowed us to investigate the morphological thickness of the layers through local elasticity differences resolving both between porous silicon layers of different porosities and between porous silicon and silicon itself. Force‐distance curves showed different adhesion behaviour: porous silicon is more hydrophobic than bulk silicon in cross sectional view. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

F. Sbrana | Lorenzo Pavesi | M. Ghulinyan

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