Dielectric Properties of Ti, TiO2 and TiN from 1.5 to 60 eV Determined by Reflection Electron Energy Loss Spectroscopy (REELS) and Ellipsometry
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J. Sanz | E. Elizalde | F. Yubero | J. Trigo | G. Fuentes | C. Quirós | J. Sanz | F. Balbás | I. G. Mancheño