Noise sources and their limitations on the performance of compound semiconductor hard radiation detectors
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M. Kanatzidis | B. Wessels | Zhifu Liu | Wenwen Lin | J. A. Peters | Joon-Il Kim | Yihui He | K. McCall | S. Das
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M. Kanatzidis | B. Wessels | Zhifu Liu | Wenwen Lin | J. A. Peters | Joon-Il Kim | Yihui He | K. McCall | S. Das