Optical absorption microscopy and spectroscopy with nanometre resolution

[1]  P. Hansma,et al.  The scanning ion-conductance microscope. , 1989, Science.

[2]  P. Hansma,et al.  An atomic-resolution atomic-force microscope implemented using an optical lever , 1989 .

[3]  J. Gimzewski,et al.  Photon emission with the scanning tunneling microscope , 1988 .

[4]  H. Kumar Wickramasinghe,et al.  High‐resolution capacitance measurement and potentiometry by force microscopy , 1988 .

[5]  C. Quate,et al.  Atomic resolution with the atomic force microscope on conductors and nonconductors , 1988 .

[6]  Josef Pelzl,et al.  Photoacoustic and Photothermal Phenomena , 1988 .

[7]  H. K. Wickramasinghe,et al.  Photothermal Imaging with Sub-100-nm Spatial Resolution , 1988 .

[8]  R. Feenstra,et al.  Tunneling spectroscopy of the GaAs(110) surface , 1987 .

[9]  Douglas E. Smith,et al.  Molecular images and vibrational spectroscopy of sorbic acid with the scanning tunneling microscope , 1987 .

[10]  Y. Martin,et al.  Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolution , 1987 .

[11]  G. Aers,et al.  Vacuum tunnelling thermopower: Normal metal electrodes , 1987 .

[12]  H. K. Wickramasinghe,et al.  Scanning thermal profiler , 1986 .

[13]  Matthew J. Smith,et al.  Rapid-scanning Fourier-transform infrared spectroscopy with photothermal beam-deflection (mirage effect) detection at the solid–liquid interface , 1986 .

[14]  Dean Ripple,et al.  Photothermal modulation of the gap distance in scanning tunneling microscopy , 1986 .

[15]  U. Dürig,et al.  Near‐field optical‐scanning microscopy , 1986 .

[16]  Paul Muralt,et al.  Scanning tunneling potentiometry , 1986 .

[17]  N. Garcia,et al.  Tunneling spectroscopy and inverse photoemission: Image and field states , 1985 .