Circuital and numerical modeling of electrostatic discharge generators

The paper provides two accurate and efficient models of electrostatic discharge (ESD) generators which permit to reproduce the discharge current in the contact mode taking into account the load effect. The first model is based on a circuit approach and is suitable to be implemented in any commercial circuit simulator. The second model is based on the numerical solution of the field equations by using the commercial numerical code microwave studio (MWS) based on the finite integration technique. The validation of the proposed circuit and numerical models is carried out by comparison with measurements.

[1]  P. Zweiacker,et al.  The correlation of rising slope and speed of approach in ESD tests , 1987 .

[2]  W.D. Greason Methodology for the characterization of the electrostatic discharge (ESD) event for bodies in approach , 1998, Conference Record of 1998 IEEE Industry Applications Conference. Thirty-Third IAS Annual Meeting (Cat. No.98CH36242).

[3]  S. Caniggia,et al.  Time domain analysis of lossy shielded cables by CAD circuit simulators , 2004, 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559).

[4]  Z. Kucerovsky,et al.  Triboelectric charging between polytetrafluoroethylene and metals , 2004, IEEE Transactions on Industry Applications.

[5]  William D. Greason,et al.  Constant energy device test for electrostatic discharge (ESD) of semiconductor devices , 1997 .

[6]  J. A. Brandão Faria Multiconductor Transmission Lines , 2005 .

[7]  David Pommerenke,et al.  ESD: waveform calculation, field and current of human and simulator ESD , 1996 .

[8]  W.D. Greason Investigation of electrostatic discharge (ESD) for a three body problem with small gaps , 2004, Conference Record of the 2004 IEEE Industry Applications Conference, 2004. 39th IAS Annual Meeting..

[9]  Keith G. Balmain,et al.  Compact traveling-wave physical simulator for human ESD , 1997 .

[10]  Ming-Dou Ker,et al.  The impact of low-holding-voltage issue in high-voltage CMOS technology and the design of latchup-free power-rail ESD clamp circuit for LCD driver ICs , 2005 .

[11]  G. Cerri,et al.  ESD indirect coupling modeling , 1996 .

[12]  Peter Richman Classification of ESD Hand/Metal Current Waves Versus Approach Speed, Voltage, Electrode Geometry and Humidity , 1986, 1986 IEEE International Symposium on Electromagnetic Compatibility.

[13]  David Pommerenke,et al.  ESD: transient fields, arc simulation and rise time limit , 1995 .

[14]  David Pommerenke,et al.  Numerical modeling of electrostatic discharge generators , 2003 .

[15]  W.D. Greason,et al.  Analysis of electrostatic discharge (ESD) for the human body and an automobile environment , 1998, Conference Record of 1998 IEEE Industry Applications Conference. Thirty-Third IAS Annual Meeting (Cat. No.98CH36242).

[16]  Ming-Dou Ker,et al.  ESD protection design of low-voltage-triggered p-n-p devices and their failure modes in mixed-voltage I/O interfaces with signal levels higher than VDD and lower than VSS , 2005 .

[17]  William D. Greason Idealized model for charged device electrostatic discharge , 1999 .

[18]  M. Raugi,et al.  Analysis of upsets and failures due to ESD by the FDTD-INBCs method , 2000 .