Hamming count-a compaction testing technique

A signature compaction method called Hamming count (H-count) is introduced. H-count is similar to a reduced Walsh spectral coefficient test, and encompasses all syndrome testable faults. H-count has both a lower masking probability and a simpler circuit design than the index vector test. The method provides an efficient and effective compaction technique.<<ETX>>

[1]  Edward J. McCluskey,et al.  Probability models for pseudorandom test sequences , 1988, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[2]  Edward McCluskey,et al.  Built-In Self-Test Techniques , 1985, IEEE Design & Test of Computers.

[3]  Arnold L. Rosenberg,et al.  Exhaustive Generation of Bit Patterns with Applications to VLSI Self-Testing , 1983, IEEE Transactions on Computers.

[4]  Edward J. McCluskey,et al.  Design for Autonomous Test , 1981, IEEE Transactions on Computers.

[5]  Edward McCluskey,et al.  Built-In Self-Test Structures , 1985, IEEE Design & Test of Computers.

[6]  Hideo Fujiwara,et al.  Logic Testing and Design for Testability , 1985 .

[7]  Richard W. Hamming,et al.  Error detecting and error correcting codes , 1950 .

[8]  D. Michael Miller,et al.  Spectral Fault Signatures for Single Stuck-At Faults in Combinational Networks , 1984, IEEE Transactions on Computers.

[9]  Jacob Savir,et al.  Syndrome-Testable Design of Combinational Circuits , 1980, IEEE Transactions on Computers.