Analysis of stray capacitance in the Kelvin method

We present a theoretical analysis of the Kelvin probe circuit taking into account both the parallel capacity induced by the connecting cables and fringing fields. We demonstrate a simple explicit solution for low modulation index e and suggest an optimized detection method for e close to unity. We extend the analysis to include stray capacitance terms for both the static‐ and vibrating‐plate earthed (spe, vpe) configurations and examine the variation in apparent contact potential difference Vapp as a function of the Kelvin probe mean spacing. This analysis is primarily intended for UHV applications where shielding problems, due either to connecting cables within the system or nonideal system configurations, e.g., imposed by sample mounting constraints, are nontrivial. Using a specially developed computer‐steered Kelvin probe and shield potential Vs coupled to a data acquisition system (DAS) we have tested the above model. We find Vapp to be linear with Vs and varies quadratically with mean spacing in both...

[1]  J. Baczynski Computer‐controlled vibrating capacitor technique for determining work function , 1988 .

[2]  Peter Feulner,et al.  An accurate and versatile vibrating capacitor for surface and adsorption studies , 1977 .

[3]  N. A. Surplice,et al.  The effects of stray capacitance on the Kelvin method for measuring contact potential difference , 1970 .

[4]  W. R. Harper The Volta effect as a cause of static electrification , 1951, Proceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences.

[5]  S. Saito,et al.  Improvements of the piezoelectric driven Kelvin probe , 1984 .

[6]  Integrated automatic modular measuring system , 1988 .

[7]  Veljko Radeka,et al.  Stress Dependence of Contact Potential: The ac Kelvin Method , 1970 .

[8]  V. L. Strashilov,et al.  An improved apparatus for surface photovoltage studies with a bimorphous piezoelectric Kelvin probe , 1987 .

[9]  L. Lassabatère,et al.  The Kelvin probe method for work function topographies: technical problems and solutions , 1984 .

[10]  K. Besocke,et al.  Piezoelectric driven Kelvin probe for contact potential difference studies , 1976 .

[11]  H. J. Krusemeyer,et al.  Analysis and Improvement of the Kelvin Method for Measuring Differences in Work Function , 1973 .

[12]  Mino Green,et al.  Solid State Surface Science , 1970 .

[13]  L. B. Harris,et al.  Vibrating capacitor measurement of surface charge , 1984 .

[14]  W. A. Zisman,et al.  A NEW METHOD OF MEASURING CONTACT POTENTIAL DIFFERENCES IN METALS , 1932 .

[15]  H. Kolm Rotating Electrometer for Comparative Work Function Measurements , 1956 .

[16]  E. M. Lifshitz,et al.  Electrodynamics of continuous media , 1961 .

[17]  T. Lee,et al.  A two frequency vibrating capacitor method for contact potential difference measurements , 1969 .

[18]  Lord Kelvin,et al.  V. Contact electricity of metals , 1898 .

[19]  N. A. Surplice,et al.  A critique of the Kelvin method of measuring work functions , 1970 .

[20]  S. Danyluk A UHV guarded Kelvin probe , 1972 .

[21]  I. Baikie,et al.  Automatic kelvin probe compatible with ultrahigh vacuum , 1989 .

[22]  R. Anderson Experimental methods in catalytic research , 1968 .

[23]  F. W. Kellaway,et al.  Advanced Engineering Mathematics , 1969, The Mathematical Gazette.

[24]  J. Parker,et al.  Kelvin Device to Scan Large Areas for Variations in Contact Potential , 1962 .

[25]  A device for measuring contact potential differences with high spatial resolution , 1977 .

[26]  J. G. Potter Temperature Dependence of the Work Function of Tungsten from Measurement of Contact Potentials by the Kelvin Method , 1940 .

[27]  R. Simon Work Function of Iron Surfaces Produced by Cleavage in Vacuum , 1959 .

[28]  K. Germanova,et al.  Highly sensitive automated setup for measuring surface photovoltage spectra , 1989 .

[29]  J. Donnet,et al.  Conditions necessary to get meaningful measurements from the Kelvin method , 1982 .

[30]  C. Domenicali,et al.  Irreversible Thermodynamics of Thermoelectricity , 1954 .

[31]  J. Donnet,et al.  New application of the Kelvin method involving the scanning of the bucking voltage , 1980 .

[32]  H. Baumgärtner,et al.  Micro Kelvin probe for local work‐function measurements , 1988 .

[33]  Electrostatically driven apparatus for measuring work function differences , 1976 .

[34]  R. Collins,et al.  Design of a guarded electrode , 1980 .

[35]  J. Carette,et al.  Le potentiel des surfaces métalliques soumises à un bombardement électronique dans un vide moyen , 1968 .

[36]  R. D. Pringle,et al.  Surface potential measurement using a rotating dynamic capacitor , 1971 .

[37]  R. K. Swank,et al.  Design of dynamic condenser electrometers. , 1947, The Review of scientific instruments.