Practical Approaches for Reliability Evaluation Using Degradation Data
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[1] Ewan Macarthur,et al. Accelerated Testing: Statistical Models, Test Plans, and Data Analysis , 1990 .
[2] Jye-Chyi Lu,et al. Statistical inference of a time-to-failure distribution derived from linear degradation , 1997 .
[3] J. Bert Keats,et al. Statistical Methods for Reliability Data , 1999 .
[4] V. Kaper,et al. Parametric degradation in transistors , 2005, Annual Reliability and Maintainability Symposium, 2005. Proceedings..
[5] Guangbin Yang. Life cycle reliability engineering , 2007 .
[6] Georges G. E. Gielen,et al. Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies , 2008, 2008 Design, Automation and Test in Europe.
[7] Georges G. E. Gielen,et al. A methodology for measuring transistor ageing effects towards accurate reliability simulation , 2009, 2009 15th IEEE International On-Line Testing Symposium.
[8] Wayne B. Nelson,et al. Defect Initiation, Growth, and Failure - A General Statistical Model and Data Analyses , 2010 .
[9] Chetan S. Kulkarni,et al. Physics Based Electrolytic Capacitor Degradation Models for Prognostic Studies under Thermal Overstress , 2012 .
[10] Huairui Guo,et al. Modeling and analysis for degradation with an initiation time , 2013, 2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS).