Local heating attacks on Flash memory devices

This paper shows how lasers can be used to implement modification attacks on EEPROM and Flash memory devices. This was achieved with inexpensive laser-diode module mounted on a microscope. By locally heating up a memory cell inside a memory array, the contents of the memory can be altered. As a result, the security of a semiconductor chip can be compromised. Even if changing each individual bit is not possible due to the small size of a memory cell, cryptographic keys can still be recovered with brute force attacks. This paper also discusses the limits for the safe use of lasers in semi-invasive attacks without damaging the device under test

[1]  William D. Brown,et al.  Nonvolatile Semiconductor Memory Technology , 1997 .

[2]  M. Kuhn,et al.  The Advanced Computing Systems Association Design Principles for Tamper-resistant Smartcard Processors Design Principles for Tamper-resistant Smartcard Processors , 2022 .

[3]  Ross J. Anderson,et al.  Optical Fault Induction Attacks , 2002, CHES.

[4]  Lawrence C. Wagner Failure Analysis of Integrated Circuits , 1999 .

[5]  Richard J. Lipton,et al.  On the Importance of Checking Cryptographic Protocols for Faults (Extended Abstract) , 1997, EUROCRYPT.

[6]  Siva Sai Yerubandi,et al.  Differential Power Analysis , 2002 .

[7]  J. Brewer,et al.  Nonvolatile semiconductor memory technology : a comprehensive guide to understanding and to using NVSM devices , 1998 .

[8]  Markus G. Kuhn,et al.  Tamper resistance: a cautionary note , 1996 .

[9]  Sergei Skorobogatov,et al.  Semi-invasive attacks: a new approach to hardware security analysis , 2005 .

[10]  Markus G. Kuhn,et al.  Low Cost Attacks on Tamper Resistant Devices , 1997, Security Protocols Workshop.

[11]  Jean-Jacques Quisquater,et al.  A Differential Fault Attack Technique against SPN Structures, with Application to the AES and KHAZAD , 2003, CHES.

[12]  Ross J. Anderson,et al.  On a new way to read data from memory , 2002, First International IEEE Security in Storage Workshop, 2002. Proceedings..

[13]  J. Bergmann,et al.  Laser crystallized multicrystalline silicon thin films on glass , 2005 .

[14]  Sergei P. Skorobogatov,et al.  Data Remanence in Flash Memory Devices , 2005, CHES.