论文信息 - Silicon oxide structures measured at the surfaces of silicon and silicate glass: a reflectivity study - 字舞流文

Silicon oxide structures measured at the surfaces of silicon and silicate glass: a reflectivity study

Andrew D. Smith | G. Greaves | G. Dorssen | M. Roper | G. Derst

[1] Baba,et al. Surface x-ray-absorption fine structures of SiOx (0 , 1993, Physical review. B, Condensed matter.

[2] Simůnek,et al. Electronic structure of amorphous SiOx:H alloy films studied by x-ray emission spectroscopy: Si K, Si L, and O K emission bands. , 1993, Physical review. B, Condensed matter.

[3] G. Greaves,et al. Glancing-angle x-ray absorption spectroscopy of corroded borosilicate glass surfaces containing uranium , 1989 .

[4] R. Temkin. An analysis of the radial distribution function of SIOx , 1975 .

[5] H. Padmore,et al. Soft x‐ray spectroscopy in atmospheric pressure helium , 1992 .