Testability Design of MPEG-2 Decoder Chip Based on Module Partition

A module-based methodology is presented to enhance the testability of the MPEG-2 decoder,with JTAG and Built-In Self-Test(BIST) technology employed.Based on the architecture features of the MPEG-2 decoder,modules are divided into three categories:memory modules,signal-correlated modules and signal-non-correlated modules.Based on the characteristics of modules,different test pattern generators are proposed,and different modules are tested in parallel.The test results show that the presented design can promote the fault coverage rate from 81% to 95.1%,comparing with the same decoder system without thinking about testability,and the hardware cost is only 3%.