Characterization of quality of BaxSr1−xTiO3 thin film by the commutation quality factor measured at microwaves
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L. Sengupta | O. Vendik | A. Kozyrev | A. Tumarkin | S. Razumov | M. Gaǐdukov | O. Buslov | A. Ivanov | Xubai Zhang | A. Gagarin | V. Keys
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