Detector discrimination in sims II. Ion-to-electron converter yield factors for negative ions

[1]  G. Scilla,et al.  Sampling error in ion microprobe analysis , 1977 .

[2]  H. Werner,et al.  Test of a quantitative approach to secondary ion mass spectrometry on glass and silicate standards , 1977 .

[3]  R. Clayton,et al.  Effect of energy selection on quantitative analysis in secondary ion microanalysis , 1977 .

[4]  U. Fehn.  Variance of ion-electron coefficients with atomic number of impacting ions , 1976 .

[5]  W. O. Hofer,et al.  Cluster induced secondary electron emission , 1976 .

[6]  D. Simons,et al.  Evaluation of the local thermal equilibrium model for quantitative secondary ion mass spectrometric analysis , 1976 .

[7]  H. Werner,et al.  Quantitative analysis of low alloy steels by secondary ion mass spectrometry , 1976 .

[8]  R. Shimizu,et al.  Practicality of the thermodynamic model for quantitative ion probe microanalysis of low alloy steels , 1975 .

[9]  U. Fehn.  Isotope effect of ion—electron emission , 1974 .

[10]  R. Shimizu,et al.  Fundamental Studies on Quantitative Analysis in Ion Probe Microanalyzer , 1974 .

[11]  C. Andersen,et al.  Thermodynamic approach to the quantitative interpretation of sputtered ion mass spectra , 1973 .

[12]  E. Larsen,et al.  Investigation of the decelerating field of an electron multiplier under negative ion impact , 1973 .

[13]  D. Cocke,et al.  Discrimination in electron multipliers for atomic ions II. Comparison of yields for 61 atoms , 1973 .

[14]  J. Goodings,et al.  Electron multiplier operation for negative ions , 1972 .

[15]  R. Glick,et al.  Electron multiplier response under positive ion impact: II. Secondary electron pulse height distributions☆ , 1970 .

[16]  R. Glick,et al.  Electron multiplier response under positive ion impact: I. Secondary electron emission coefficients , 1970 .

[17]  C. Andersen.  Analytic methods for the ion microprobe mass analyzer. Part II. , 1970 .

[18]  R. Goutte,et al.  Emission électronique secondaire d'une cible de molybdène bombardée par des ions positifs et négatifs d'un même élément , 1969 .

[19]  J. M. Schroeer.  Secondary-ion emission from iron alloys under various bombarding conditions , 1977 .

[20]  R. F. Pottie,et al.  Discrimination in electron multipliers for atomic ions 1. Multiplier yields for 24 mass-analyzed ions , 1973 .

[21]  C. Andersen.  Progress in analytic methods for the ion microprobe mass analyzer , 1969 .