Effect of SiO2 incorporation on stability and work function of conducting MoO2
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C. Tracy | P. Fejes | Y. Liang | E. Weisbrod | N. Theodore | Y. Liang
[1] D. Gilmer,et al. Interface dipole and effective work function of Re in Re∕HfO2∕SiOx∕n-Si gate stack , 2006 .
[2] David G. Seiler,et al. Characterization and metrology for ULSI technology , 2006 .
[3] B. E. White,et al. Impact of Deposition and Annealing Temperature on Material and Electrical Characteristics of ALD HfO2 , 2004 .
[4] B. E. White,et al. Contributions to the effective work function of platinum on hafnium dioxide , 2004 .
[5] R. Droopad,et al. Heteroepitaxy of SrTiO3 on vicinal Si(001): Growth and kinetic effects , 2004 .
[6] S. Ferrari,et al. Oxygen diffusion in atomic layer deposited ZrO2 and HfO2 thin films on Si (100) , 2004 .
[7] I. Baikie,et al. Study of high- and low-work-function surfaces for hyperthermal surface ionization using an absolute Kelvin probe , 2001 .
[8] W. M. Haynes. CRC Handbook of Chemistry and Physics , 1990 .
[9] W. O'grady,et al. The surface structure of RuO2: A leed, auger and XPS study of the (110) and (100) faces , 1988 .