论文信息 - Heavy Ion-Induced Single Event Upsets of Microcircuits; A Summary of the Aerospace Corporation Test Data

Heavy Ion-Induced Single Event Upsets of Microcircuits; A Summary of the Aerospace Corporation Test Data

A summary of heavy ion SEU and latch-up data collected within the last several years is presented in this report. The devices tested range from simple logic circuits to microprocessors including examples of bipolar, CMOS, and NMOS technologies.

R. Koga | W. A. Kolasinski

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