Remote plasma chemical vapour deposition of group III-nitride tunnel junctions for LED applications

The low growth temperature technology Remote Plasma Chemical Vapour Deposition (RPCVD) is currently being developed by BluGlass Ltd. for use in high-brightness LED applications. The unique growth conditions of RPCVD are demonstrated to produce Activated As-Grown (AAG) buried p-GaN for achieving GaN-based tunnel junctions (TJ) for use in current spreading and potential use in cascade LED and LD applications. Hybrid RPCVD/MOCVD TJs were grown on commercial full blue LEDs, and all-RPCVD TJs were grown on commercial partially completed blue LEDs and the devices were processed into 1.1 mm x 1.1mm chips. The LEDs with hybrid TJ displayed a 4.4% increase in light output power (LOP) and an increase in forward voltage (Vf) of 0.68 V compared to LEDs using indium-tin oxide (ITO) at a current density of 26 A/cm2 . The LEDs with all-RPCVD TJs displayed a 3.6% increase in LOP and an increase in Vf of 0.88 V at 26 A/cm2 .

[1]  S. A. Stockman,et al.  GaN-Based Light Emitting Diodes with Tunnel Junctions , 2001 .

[2]  S. Kamiyama,et al.  Lateral Hydrogen Diffusion at p-GaN Layers in Nitride-Based Light Emitting Diodes with Tunnel Junctions , 2013 .

[3]  B. Leung,et al.  Tandem Structure for Efficiency Improvement in GaN Based Light-Emitting Diodes , 2014, Journal of Lightwave Technology.

[4]  S. Kamiyama,et al.  GaInN‐based tunnel junctions with high InN mole fractions grown by MOVPE , 2015 .

[5]  S. Rajan,et al.  GaN-based three-junction cascaded light-emitting diode with low-resistance InGaN tunnel junctions , 2015 .

[6]  M. Wintrebert-Fouquet,et al.  Modeling and experimental analysis of RPCVD based nitride film growth , 2008, SPIE OPTO.

[7]  Lai Wang,et al.  Efficiency Droop Effect Mechanism in an InGaN/GaN Blue MQW LED , 2011 .

[8]  C. Weisbuch,et al.  Direct measurement of Auger electrons emitted from a semiconductor light-emitting diode under electrical injection: identification of the dominant mechanism for efficiency droop. , 2013, Physical review letters.

[9]  S. Rajan,et al.  InGaN/GaN Tunnel Junctions For Hole Injection in GaN Light Emitting Diodes , 2014, 1403.3932.

[10]  M. S. Cho,et al.  GaN-based light-emitting diodes using tunnel junctions , 2002 .

[11]  J. Piprek GaN-based bipolar cascade light-emitting diode with 250 % peak quantum efficiency , 2015 .

[12]  Motoaki Iwaya,et al.  GaInN-Based Tunnel Junctions in n–p–n Light Emitting Diodes , 2013 .

[13]  S.C. Wang,et al.  Temperature-Dependent Electroluminescence Efficiency in Blue InGaN–GaN Light-Emitting Diodes With Different Well Widths , 2010, IEEE Photonics Technology Letters.

[14]  Hongping Zhao,et al.  Analysis of Internal Quantum Efficiency and Current Injection Efficiency in III-Nitride Light-Emitting Diodes , 2013, Journal of Display Technology.

[15]  Liann-Be Chang,et al.  Effect of Electron Leakage on Efficiency Droop in Wide-Well InGaN-Based Light-Emitting Diodes , 2011 .

[16]  J. Piprek Origin of InGaN/GaN light-emitting diode efficiency improvements using tunnel-junction-cascaded active regions , 2014 .

[17]  S. Chang,et al.  Cascaded GaN Light-Emitting Diodes With Hybrid Tunnel Junction Layers , 2015, IEEE Journal of Quantum Electronics.

[18]  S. Denbaars,et al.  Hybrid tunnel junction contacts to III–nitride light-emitting diodes , 2016 .