ANC-based method for testing converters with random-phase harmonics

In this paper, we present an extension of the ANC (“Analogue Network of Converters”)-based method to characterize the harmonic components of a set of converters with random-phase harmonics using only digital test resources. The ANC-based method was primarily developed under the assumption that the harmonics' phase is proportional to the input phase. This assumption is not valid for all converter architectures, where filtering effects may affect the harmonics' phase. The improved ANC-based method is able to calculate the magnitude of the harmonic components regardless of their phase. The simulation results and the experiments show an excellent agreement between the values measured using the method and the values measured with a usual test setup, for the THD and SFDR parameters.

[1]  Jean-Marie Janik,et al.  A spectral approach to estimate the INL of A/D converter , 2007, Comput. Stand. Interfaces.

[2]  Abhijit Chatterjee,et al.  A signature analyzer for analog and mixed-signal circuits , 1994, Proceedings 1994 IEEE International Conference on Computer Design: VLSI in Computers and Processors.

[3]  Florence Azaïs,et al.  "Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC , 2007, 12th IEEE European Test Symposium (ETS'07).

[4]  Gordon W. Roberts,et al.  A BIST scheme for an SNR test of a sigma-delta ADC , 1993, Proceedings of IEEE International Test Conference - (ITC).

[5]  Gordon W. Roberts,et al.  An Introduction to Mixed-Signal IC Test and Measurement , 2000 .

[6]  Matthew Mahoney,et al.  DSP-Based Testing of Analog and Mixed-Signal Circuits , 1987 .

[7]  Florence Azaïs,et al.  Implementation of a linear histogram BIST for ADCs , 2001, Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001.

[8]  Florence Azaïs,et al.  A novel DFT technique for testing complete sets of ADCs and DACs in complex SiPs , 2006, IEEE Design & Test of Computers.

[9]  Gordon W. Roberts,et al.  A BIST technique for a frequency response and intermodulation distortion test of a sigma-delta ADC , 1994, Proceedings of IEEE VLSI Test Symposium.

[10]  Karim Arabi,et al.  A New Built-in Self-test Approach For Digital-to-analog And Analog-to-digital Converters , 1994, IEEE/ACM International Conference on Computer-Aided Design.

[11]  Mariane Comte,et al.  A Novel DFT Technique to Test a Complete Set of ADC's and DAC's Embedded in a Complex SiP , 2006 .

[12]  Michel Renovell,et al.  Towards an ADC BIST scheme using the histogram test technique , 2000, Proceedings IEEE European Test Workshop.

[13]  Stephen K. Sunter,et al.  A simplified polynomial-fitting algorithm for DAC and ADC BIST , 1997, Proceedings International Test Conference 1997.

[14]  José L. Huertas Test and Design-for-Testability in Mixed-Signal Integrated Circuits , 2004 .

[15]  Ieee Std,et al.  IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters , 2011 .

[16]  Florence Azaïs,et al.  ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator , 2008, VLSI Design.