论文信息 - SiC/SiO2 interface traps effect on SiC MOSFETs Gate capacitance with biased Drain - 字舞流文

SiC/SiO2 interface traps effect on SiC MOSFETs Gate capacitance with biased Drain

A. Irace | A. Castellazzi | S. Daliento | G. Breglio | L. Maresca | M. Riccio | I. Matacena