A numerical study on radiation hardness of low-resistivity Si-microstrip detectors
暂无分享,去创建一个
The adoption of low-resistivity materials has been proposed has an effective mean for the optimization of the long-term radiation-hardness of silicon microstrip detectors for high-energy physics applications. A comprehensive CAD-based analysis has been carried out, comparing the performance delivered by high- and low-resistivity starting materials over the wide range of fluences and applied biases foreseen at LHC. Some encouraging results have been obtained in terms of long-term performance optimization (i.e. charge collection efficiency) using low-resistivity devices.
[1] Paolo Ciampolini,et al. Comprehensive modeling of silicon microstrip detectors , 1996 .
[2] Eckhart Fretwurst,et al. Neutron induced defects in silicon detectors characterized by DLTS and TSC methods , 1996 .
[3] P. Ciampolini,et al. TCAD-based analysis of radiation-hardness in silicon detectors , 1998 .
[4] Zheng Li,et al. Investigation on the long-term radiation hardness of low and medium resistivity starting silicon materials for RT silicon detectors in high energy physics☆ , 1995 .