InGaP-Plus™: Advanced GaAs BiFET Technology and Applications

The InGaP-Plus™ BiFET technology has been developed at ANADIGICS for high volume production of commercial MMICs. The vertical integration of the InGaP HBT and the pHEMT on the same 6 inch GaAs epitaxial wafer allows independent optimization of each device for a given application. This is possible since the only shared epitaxial layer among those of the HBT and pHEMT structure is a heavily n-doped layer located between the HBT and the FET structure. Otherwise, the process flow has been developed to minimize cost and maximize yield. The InGaP-Plus™ BiFET technology allows greater integration of the various dc and rf functions required in front end modules on a single chip.

[1]  Mau-Chung Frank Chang,et al.  A GaAs BiFET LSI technology , 1994, Proceedings of 1994 IEEE GaAs IC Symposium.

[2]  T. Arell,et al.  InGaP-Plus - A major advance in GaAs HBT Technology , 2006, 2006 IEEE Compound Semiconductor Integrated Circuit Symposium.

[3]  Kevin W. Kobayashi,et al.  Monolithic HEMT-HBT integration by selective MBE , 1995 .