论文信息 - Effect of the epitaxial layer features on the reliability of medium blocking voltage power VDMOSFET during heavy ION exposure - 字舞流文

Effect of the epitaxial layer features on the reliability of medium blocking voltage power VDMOSFET during heavy ION exposure

F. Velardi | G. Busatto | F. Iannuzzo | F. Frisina | G. Currò | A. Candelori | A. Cavagnoli | J. Wyss | A. Sanseverino | A. Cascio