Assessing the Correlation Between Location and Size of Catastrophic Breakdown Events in High-K MIM Capacitors
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P. Hurley | G. Reimbold | E. Miranda | J. Suñé | S. Monaghan | K. Cherkaoui | F. Campabadal | D. Blachier | J. Muñoz-Gorriz
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P. Hurley | G. Reimbold | E. Miranda | J. Suñé | S. Monaghan | K. Cherkaoui | F. Campabadal | D. Blachier | J. Muñoz-Gorriz