论文信息 - Modern methods for thin film and surface analyses - 字舞流文

Modern methods for thin film and surface analyses

[1] C. Magee,et al. Secondary ion quadrupole mass spectrometer for depth profiling--design and performance evaluation. , 1978, The Review of scientific instruments.

[2] J. D. Fassett,et al. Quantitation of secondary ion mass spectrometric images by microphotodensitometry and digital image processing , 1977 .

[3] G. Scilla,et al. Sampling error in ion microprobe analysis , 1977 .

[4] P. Williams,et al. Depth profile detection limit of 3×1015 atom cm−3 for As in Si using Cs+ bombardment negative secondary ion mass spectrometry , 1977 .

[5] G. R. Ringo,et al. Microprobe design using a liquid gallium ion source , 1976 .

[6] H. Liebl. Ion probe microanalysis , 1975 .

[7] R. Shimizu,et al. Computer simulation of knock-on effect under ion bombardment , 1974 .

[8] H. Liebl. A Coaxial Combined Electrostatic Objective and Anode Lens for Microprobe Mass Analysers , 1972 .

[9] F. Ruedenauer. Some basic considerations concerning the sensitivity of sputter ion mass spectrometers , 1971 .

[10] H. Dudek. Calculation of the spatial distribution of ionization density in a material due to electron beam irradiation , 1980 .

[11] H. Werner. New Developments in Secondary Ion Mass Spectrometry , 1980 .