Temperature dependence of MOSFET substrate current

Hitherto, theoretical models for MOSFET substrate current predicted that substrate current is a strong function of temperature. However, experimental data presented in this and previous studies show that the ratio of substrate current to drain current is insensitive to temperature over the range 77 to 300 K. The authors propose a modified model for an electron mean-free path (MFP) in the substrate current based on the concept of energy relaxation. The different between the energy and momentum relaxation MFP is clarified, and it is shown that a substrate current model with modified MFP can explain the temperature dependence of the substrate current.<<ETX>>

[1]  N. Arora,et al.  MOSFET substrate current model for circuit simulation , 1991 .

[2]  B. Ridley Lucky-drift mechanism for impact ionisation in semiconductors , 1983 .

[3]  J. Plummer,et al.  Substrate current in N-channel and P-channel MOSFETs between 77K and 300K: Characterization and simulation , 1985, 1985 International Electron Devices Meeting.

[4]  G. Baccarani,et al.  An investigation of steady-state velocity overshoot in silicon , 1985 .

[5]  S. M. Sze,et al.  Physics of semiconductor devices , 1969 .

[6]  C. R. Crowell,et al.  Temperature dependence of avalanche multiplication in semiconductors , 1966 .

[7]  C. R. Crowell,et al.  Temperature dependence of avalanche multiplication in semiconductors , 1966 .

[8]  J.D. Plummer,et al.  Substrate current at cryogenic temperatures: Measurements and a two-dimensional model for CMOS technology , 1987, IEEE Transactions on Electron Devices.

[9]  Conyers Herring,et al.  Transport properties of a many-valley semiconductor , 1955 .

[10]  Chenming Hu,et al.  Hot-electron-induced MOSFET degradation—Model, monitor, and improvement , 1985, IEEE Transactions on Electron Devices.

[11]  T. Chan,et al.  A novel high-speed, 5-volt programming EPROM structure with source-side injection , 1986, 1986 International Electron Devices Meeting.

[12]  C. R. Crowell,et al.  Electron-optical-phonon scattering in the emitter and collector barriers of semiconductor-metal-semiconductor structures , 1965 .

[13]  G. Gildenblat,et al.  Low-temperature substrate current characterization of N-channel MOSFET's , 1985, 1985 International Electron Devices Meeting.