Numerical simulation of stress evolution during electromigration in IC interconnect lines
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[1] K. Garikipati,et al. A lattice-based micromechanical continuum formulation for stress-driven mass transport in polycrystalline solids , 2001 .
[2] Yu-Lin Shen,et al. On the prediction of electromigration voiding using stress-based modeling , 2000 .
[3] T. M. Makhviladze,et al. General model for mechanical stress evolution during electromigration , 1999 .
[4] D. Maroudas,et al. Theoretical analysis of electromigration-induced failure of metallic thin films due to transgranular void propagation , 1999 .
[5] C. Thompson,et al. Simulation of the temperature and current density scaling of the electromigration-limited reliability of near-bamboo interconnects , 1998 .
[6] J. Clement. Reliability analysis for encapsulated interconnect lines under dc and pulsed dc current using a continuum electromigration transport model , 1997 .
[7] G. Povirk,et al. Numerical Simulations of Electromigration and Stress-Driven Diffusion in Polycrystalline Interconnects , 1997 .
[8] Eicke R. Weber,et al. Three-Dimensional Finite Element Simulation of Electro and Stress Migration Effects in Interconnect Lines , 1997 .
[9] J. J. Clement,et al. Modeling electromigration‐induced stress evolution in confined metal lines , 1995 .
[10] M. Korhonen,et al. Stress evolution due to electromigration in confined metal lines , 1993 .
[11] Reiner Kirchheim,et al. Stress and electromigration in Al-lines of integrated circuits , 1992 .
[12] Tu. Electromigration in stressed thin films. , 1992, Physical review. B, Condensed matter.
[13] I. Blech,et al. Measurement of stress gradients generated by electromigration , 1977 .
[14] Conyers Herring,et al. Stress generation by electromigration , 1976 .
[15] I. Blech. Electromigration in thin aluminum films on titanium nitride , 1976 .
[16] E. Kinsbron,et al. Electromigration in thin gold films on molybdenum surfaces , 1975 .
[17] J. D. Eshelby. The determination of the elastic field of an ellipsoidal inclusion, and related problems , 1957, Proceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences.