论文信息 - Quantitative Imaging of the Stress/Strain Fields and Generation of Macroscopic Cracks from Indents in Silicon - 字舞流文

Quantitative Imaging of the Stress/Strain Fields and Generation of Macroscopic Cracks from Indents in Silicon

A. Danilewsky | P. McNally | B. Tanner | J. Wittge | D. Allen | J. Garagorri | M. R. Elizalde | E. Gorostegui-Colinas