论文信息 - Neutron SEE Testing of the 65nm SmartFusion2 Flash-Based FPGA

Neutron SEE Testing of the 65nm SmartFusion2 Flash-Based FPGA

SmartFusion2 Flash-based Reprogrammable FPGAs are Neutron beam tested. Results confirm immunity of SEL and configuration upset with an elevated temperature approximately 95 oC. SEU is discussed for the Fabric Logic, Global logic, SRAM, PLL and SEFI on the MSS.

Nadia Rezzak | Jih-Jong Wang | Durwyn Dsilva | Narayan Jat

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